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Cross-sectional TEM images of the SLs grown on GaSb(001) taken along the  zone axis. Inset: the selected area electron-diffraction patterns used for the cross-sectional TEM lattice-fringe image.
(a) HRTEM images showing interfaces (a) on InAs, and (b) InAs on . (b) The regions shows the GaInSb/InAs interfacial structure.
Line profile showing change in average separation of 8(110) planes across different interfaces.
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