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Experimental demonstration of reflection minimization at two-dimensional photonic crystal interfaces via antireflection structures
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10.1063/1.3176949
/content/aip/journal/apl/95/1/10.1063/1.3176949
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3176949
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Figures

Image of FIG. 1.
FIG. 1.

(a) In the conventional 1D case, the refractive index and the thickness h of an antireflection layer are the antireflection parameters. (b) In the 2D PC case, the radius of rods and the distance between the ARC structure and the crystal truncation are the design parameters of the ARC structure.

Image of FIG. 2.
FIG. 2.

Schematic diagram of the PC with the ARC structure. Two acrylic plates, each with an aluminum sheet attached hold the sample vertically.

Image of FIG. 3.
FIG. 3.

(a) Equifrequency surfaces of the 2D PC which are obtained by the plane-wave expansion method. The inset represents the cross-sectional view of the 2D square lattice PC composed of alumina rods in air. (b) Transmittance of microwaves without any ARC structure and (c) with the ARC structure applied for the frequency range of 12.1 to 12.9 GHz propagating along the direction as a function of position. The black line with rectangular points indicates the reference transmission which is measured without the PC at 12.5 GHz.

Image of FIG. 4.
FIG. 4.

(a) Transmission spectra obtained with the 2D FDTD calculations for the PC sample with (red line) and without the ARC (black line) structure. (b) Experimentally measured transmission spectra of the PC sample which are composed of alumina rods with (red line) and without the ARC (black line) structure.

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/content/aip/journal/apl/95/1/10.1063/1.3176949
2009-07-10
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental demonstration of reflection minimization at two-dimensional photonic crystal interfaces via antireflection structures
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3176949
10.1063/1.3176949
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