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x-ray profiles of Pt, Pt–Ir, and Ir BE layers grown on substrates.
AFM surface images of (a) Pt, (b) Pt–Ir, and (c) Ir BE layers grown at . The measurement range is .
(a) XRD profile of NiO thin film grown on a Pt–Ir BE layer at . Inset shows a reciprocal space map around the (1 1 3) Bragg reflection of the NiO thin film.
Cross-sectional TEM images of the single-crystal epitaxial NiO(100) thin film grown on Pt–Ir bottom electrode. (a) Wide-area image and (b) enlarged view.
RS behaviors observed in the single-crystal epitaxial NiO(100) thin film grown on the Pt–Ir BE layer. (a) Initially off-state behavior observed for a cell and (b) initially on-state behavior for a cell.
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