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Resistance switching in a single-crystalline NiO thin film grown on a electrode
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10.1063/1.3179169
/content/aip/journal/apl/95/1/10.1063/1.3179169
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3179169
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

x-ray profiles of Pt, Pt–Ir, and Ir BE layers grown on substrates.

Image of FIG. 2.
FIG. 2.

AFM surface images of (a) Pt, (b) Pt–Ir, and (c) Ir BE layers grown at . The measurement range is .

Image of FIG. 3.
FIG. 3.

(a) XRD profile of NiO thin film grown on a Pt–Ir BE layer at . Inset shows a reciprocal space map around the (1 1 3) Bragg reflection of the NiO thin film.

Image of FIG. 4.
FIG. 4.

Cross-sectional TEM images of the single-crystal epitaxial NiO(100) thin film grown on Pt–Ir bottom electrode. (a) Wide-area image and (b) enlarged view.

Image of FIG. 5.
FIG. 5.

RS behaviors observed in the single-crystal epitaxial NiO(100) thin film grown on the Pt–Ir BE layer. (a) Initially off-state behavior observed for a cell and (b) initially on-state behavior for a cell.

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/content/aip/journal/apl/95/1/10.1063/1.3179169
2009-07-10
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Resistance switching in a single-crystalline NiO thin film grown on a Pt0.8Ir0.2 electrode
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/1/10.1063/1.3179169
10.1063/1.3179169
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