Full text loading...
(a) The x-ray diffraction patterns of a continuous film and lithographically produced NiTi micron-scale lines, annealed at for 20 min (the inset is a scan from a general area detector diffraction system) (b) the grain size distribution with corresponding TEM image (inset) for the films and (c) for lines.
(a) The surface morphology of continuous sputter-deposited NiTi films and (b) lithographically produced NiTi micron-scale lines as viewed by SEM. The associated surface profiles measured by AFM are inset in each.
The volume average stress as a function of temperature for a continuous film and micron-lines measured parallel and perpendicular to their length.
The transformation temperatures, hysteresis, and interval for continuous films and patterned lines.
Article metrics loading...