1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Mesoporous silica films with varying porous volume fraction: Direct correlation between ortho-positronium annihilation decay and escape yield into vacuum
Rent:
Rent this article for
USD
10.1063/1.3234381
/content/aip/journal/apl/95/12/10.1063/1.3234381
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/12/10.1063/1.3234381
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

measured lifetime components (left), [142 ns, ], and “ escape” model calculations (right)—annihilation lifetime in pores, (d), escape rate and yield, (e), and (f)—for 3 keV positrons in mesoporous silica CTAB-TEOS film/glass for CTAB/Si mole fraction in the range of 0–0.14.

Image of FIG. 2.
FIG. 2.

escape rate, , for 3 keV positrons as a function of the mesopore volume fraction in mesoporous silica films for and (inset) corresponding escape yield vs refractive index measured at 633 nm wavelength.

Loading

Article metrics loading...

/content/aip/journal/apl/95/12/10.1063/1.3234381
2009-09-24
2014-04-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Mesoporous silica films with varying porous volume fraction: Direct correlation between ortho-positronium annihilation decay and escape yield into vacuum
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/12/10.1063/1.3234381
10.1063/1.3234381
SEARCH_EXPAND_ITEM