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In-depth resolved Raman scattering analysis of secondary phases in Cu-poor based thin films
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10.1063/1.3236770
/content/aip/journal/apl/95/12/10.1063/1.3236770
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/12/10.1063/1.3236770
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Raman spectra from the surface of the different samples, normalized to the intensity of the mode from : (a) , (b) , (c) , (d) , (e) , (f) , (g) , (h) , and (i) . Presence of OVC phases is also reflected in the enhancement in the intensity of and symmetry modes at the spectral region (see Ref. 6).

Image of FIG. 2.
FIG. 2.

Raman spectra from sample with after sputtering with different times: (a) 0 min, (b) 10 min, (c) 20 min, (d) 30 min, (e) 40 min, and (f) 50 min. The spectra are normalized to the intensity of the OVC mode. Inset in the figure shows the spectra directly measured on the front (a) and back (b) surfaces of a sample mechanically removed from the substrate.

Image of FIG. 3.
FIG. 3.

Micro-Raman spectra measured with the laser spot focused at different positions from the cross-section of the layer with [(a) surface region, (b) mid region, and (c) back region], together with those directly measured from the front (s) and back (b) surfaces of a sample mechanically removed from the substrate. The spectra are normalized to the intensity of the main CH- mode. Lower inset in the figure shows a SEM image of the cross section of the layer. Upper inset in the figure shows the evolution of the relative integral intensity of the OVC mode in relation to the CH- one from samples with and , as deduced form the fitting of the corresponding spectra.

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/content/aip/journal/apl/95/12/10.1063/1.3236770
2009-09-24
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: In-depth resolved Raman scattering analysis of secondary phases in Cu-poor CuInSe2 based thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/12/10.1063/1.3236770
10.1063/1.3236770
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