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[(a) and (b)] STM images of the ZnO(0001) surface recorded at and −1.5 V, respectively. (c) Height difference between images [(a) and (b)]; dotted circles indicate typical regions where the contrast is enhanced due to local electronic structure inhomogeneities. (d) Same as (c) including a contour plot of the local roughness. Red contours surround regions where the local surface roughness (standard deviation calculated over a area) on (a) is below 9 pm.
(a) Mapping of the LDOS at on the same area as in Fig. 1. (b) curves measured at the location of the circles in (a) [also reproduced in Fig. 1(a)]. (c) profile along the dotted line in (a).
(a) Atomically resolved STM image (, ). [(b) and (c)] Fourier transforms of the areas inside the rectangles drawn in (a).
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