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Ultrasmall penetration depth in nanoscale thermal radiation
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10.1063/1.3238315
/content/aip/journal/apl/95/13/10.1063/1.3238315
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/13/10.1063/1.3238315

Figures

Image of FIG. 1.
FIG. 1.

Nanoscale thermal radiation between plates at and , separated by a vacuum gap of width .

Image of FIG. 2.
FIG. 2.

Graph of as a function of the product at the SPP resonance frequency (given in Table I) for SiC and -type Si with doping concentrations of and .

Image of FIG. 3.
FIG. 3.

The distributions of the spectral and total Poynting vector ( component) near the surfaces of the emitter and receiver normalized to that in the vacuum: (a) SiC and (b) doped Si. The wavelength corresponding to the resonance frequency listed in Table I is also indicated.

Tables

Generic image for table
Table I.

Parameters at the SPP resonance frequency and the corresponding penetration depths. Note that and .

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/content/aip/journal/apl/95/13/10.1063/1.3238315
2009-09-28
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultrasmall penetration depth in nanoscale thermal radiation
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/13/10.1063/1.3238315
10.1063/1.3238315
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