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(a) Illustration of the TFRRAM device structure and (b) optical transmission spectrum. A bottom logo (KAIST) place on the TFRRAM device is also shown [in the inset of (b)] due to the high transparency.
(a) Resistive switching characteristics of the TFRRAM device, (b) data retention properties, and (c) switching cycling test for the HRS and LRS.
plot of the HRS. (inset: Ohmic conduction in the LRS due to the linear slope of in the plot.)
(a) Bending effect of the TFRRAM device. Photograph (shown in the inset) of the device bent at . (b) Continuous bending effect of the TRRAM device.
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