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Grazing incidence fast atom diffraction: An innovative approach to surface structure analysis
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View: Figures


Image of FIG. 1.
FIG. 1.

Basic scheme for GIFAD. A beam of , at energies near 1 keV, is first neutralized in a He gas cell then collimated before impinging the sample surface at incidence angles in the range of 0.5°–2°. The scattered beam is collected on a detector typically made of a microchannel plate and a phosphor screen.

Image of FIG. 2.
FIG. 2.

Diffraction images recorded with 400 eV He on the reconstructed ZnSe(001), for the directions , [110], and [100]. The narrow spot on the lower part is the direct beam.

Image of FIG. 3.
FIG. 3.

LEED and RHEED patterns of the ZnSe(001) sample.

Image of FIG. 4.
FIG. 4.

Quantitative analysis of the [110] diffraction data. (a) The diffraction spectrum is fitted with five Fourier components in the corrugation function. (b) Comparison of the best fits obtained with , 3, and 5. (c) Comparison of the corresponding corrugation functions derived from the fits in (b); is the crystal period along the [110] direction.

Image of FIG. 5.
FIG. 5.

Corrugation functions derived from the fit to the experimental data. and are respectively the coordinate and the period along the transverse direction. Projected atomic positions are given in the lower part; large and small filled circles are Zn and Se atoms, respectively.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Grazing incidence fast atom diffraction: An innovative approach to surface structure analysis