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Basic scheme for GIFAD. A beam of , at energies near 1 keV, is first neutralized in a He gas cell then collimated before impinging the sample surface at incidence angles in the range of 0.5°–2°. The scattered beam is collected on a detector typically made of a microchannel plate and a phosphor screen.
Diffraction images recorded with 400 eV He on the reconstructed ZnSe(001), for the directions , , and . The narrow spot on the lower part is the direct beam.
LEED and RHEED patterns of the ZnSe(001) sample.
Quantitative analysis of the  diffraction data. (a) The diffraction spectrum is fitted with five Fourier components in the corrugation function. (b) Comparison of the best fits obtained with , 3, and 5. (c) Comparison of the corresponding corrugation functions derived from the fits in (b); is the crystal period along the  direction.
Corrugation functions derived from the fit to the experimental data. and are respectively the coordinate and the period along the transverse direction. Projected atomic positions are given in the lower part; large and small filled circles are Zn and Se atoms, respectively.
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