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Cross-section TEM images of epitaxial growths of 7 nm Fe/4 nm hybrid structures. (a) GaAs , (b) , and (c) InAs substrates. The insets are the corresponding TEM images of lower magnification showing the Fe morphology changes. The arrows in (b) and (c) indicate 3D Fe islands. (d) Microdiffraction patterns from Fe/MgO (top), (middle), and (bottom) interfacial regions. Lines were drawn on the pattern to discern reciprocal lattice of Fe (pink dashed line), MgO (yellow dotted line), and (sky blue dot dashed line). Red and blue arrows in (d) indicate growth and interface directions, respectively.
AFM images of 7 nm Fe/4 nm MgO/InAs structures with MgO layers grown at different temperatures: (a) RT, (b) , (c) , and (d) . The arrows in (d) indicate the pinholes.
Calculated strains in MgO layers from the various lattice registries between MgO and substrates.
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