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Growth and properties of chemical solution deposited films
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10.1063/1.3250165
/content/aip/journal/apl/95/16/10.1063/1.3250165
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/16/10.1063/1.3250165
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) XRD patterns of thin films annealed at and (b) lattice parameters of thin films . The black squares correspond to the buffer layer; the open symbols are from the films.

Image of FIG. 2.
FIG. 2.

Polarization—electric field hysteresis loops of a film annealed at .

Image of FIG. 3.
FIG. 3.

The dielectric properties of thin films as a function of temperature.

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/content/aip/journal/apl/95/16/10.1063/1.3250165
2009-10-19
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Growth and properties of chemical solution deposited BiInO3–PbTiO3 films
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/16/10.1063/1.3250165
10.1063/1.3250165
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