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Reliability properties of metal-oxide-semiconductor capacitors using high- dielectric
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10.1063/1.3250242
/content/aip/journal/apl/95/16/10.1063/1.3250242
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/16/10.1063/1.3250242
/content/aip/journal/apl/95/16/10.1063/1.3250242
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/content/aip/journal/apl/95/16/10.1063/1.3250242
2009-10-19
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reliability properties of metal-oxide-semiconductor capacitors using LaAlO3 high-k dielectric
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/16/10.1063/1.3250242
10.1063/1.3250242
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