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Identification and lattice location of oxygen impurities in
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Schematic structure of bulk in the [0001] crystalline orientation. (b) Annular dark field -contrast STEM image (raw data) of bulk . Green arrow shows the position in the image where a horizontal intensity line profile was taken (formed by summing over a width of 0.04 nm). Filled (solid line) region in the intensity line profile shows the raw (low-pass filtered) data, respectively. Yellow dashed circumference in (b) highlights the atomic structure represented in the schematic shown in (a).

Image of FIG. 2.
FIG. 2.

(a) Normalized intensities of the N1, N2, and N3 atomic columns for the experimental and Bloch-wave simulated images. (b) EELS obtained from a area and a single N3 column showing oxygen present in the N3 column.

Image of FIG. 3.
FIG. 3.

Simulated -edge spectrum images of bulk . The images were calculated such that only the inelastic scattering contribution arising from a particular N column (N1, N2, N3, and N4) were taken into account while keeping intact the elastic scattering contribution of all the N and Si atoms. The intensity of the spectrum images has been normalized with respect to the minimum and maximum signal coming from the N1 atomic columns.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Identification and lattice location of oxygen impurities in α-Si3N4