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Controllable local modification of fractured Nb-doped surfaces
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10.1063/1.3254184
/content/aip/journal/apl/95/16/10.1063/1.3254184
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/16/10.1063/1.3254184
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) STM image (set point: 50 pA at 1.4 V) of a LT fractured STO surface, the inset shows the high resolution image, (b) the line profile taken as indicated in (a), and (c) the line profile taken as indicated in the inset image.

Image of FIG. 2.
FIG. 2.

(a) STM image and (b) image (set point: 50 pA at 1.4 V) after creating holes by positive voltage pulses. (c) Summary of (a) and (b). The size of the dot indicates the width and the color scale is used to describe the depths of the holes. Black dash-dotted line indicates the threshold for creation of holes; red dotted line indicates the threshold for observing electronic structure.

Image of FIG. 3.
FIG. 3.

(a) A systematic test for the creation of the hole array by applying 2.4 V pulses for 1 s (post writing image set point: 50 pA at 1.4 V). The histograms of the (b) width and (c) depth of the created holes.

Image of FIG. 4.
FIG. 4.

(a) Before and (b) after applying negative bias (−5 V for 3 s) to refill the hole created by 2.4 V for 1 s. (c) The line profiles indicated in (a) and (b).

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/content/aip/journal/apl/95/16/10.1063/1.3254184
2009-10-21
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Controllable local modification of fractured Nb-doped SrTiO3 surfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/16/10.1063/1.3254184
10.1063/1.3254184
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