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In situ XRD measurement.
Variation vs temperature of the XRD intensity of the (square) and circle) diffracted peaks during in situ heat treatment from 120 to . The continuous lines correspond to the simulation.
DSC signal vs sample temperature measured during sample annealing following a ramp of 25, 50, 75, and . The continuous lines correspond to the simulation.
Schematic of the model for the behavior of the transient phase. This model was used to simulate the DSC and XRD experiment.
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