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Locating La atoms in epitaxial films through atomic resolution electron energy loss spectroscopy mapping
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10.1063/1.3258491
/content/aip/journal/apl/95/19/10.1063/1.3258491
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/19/10.1063/1.3258491
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The atomic resolution HAADF image of BLT film deposited on (100)SRO/STO showing a defect-free region.

Image of FIG. 2.
FIG. 2.

The atomic resolution HAADF image of the interface between BLT and the (100)SRO/STO substrate showing a defect area (pointed by arrows on the left) and a defect-free area (right).

Image of FIG. 3.
FIG. 3.

(a) HAADF image of BLT with the area from which EELS mapping was carried out highlighted with a green square, (b) HAADF intensity recorded simultaneously while the EELS spectra in the region of interest [green square in (a)] are acquired, (c) the EELS composite Ti (red online) and La (green online) map, (d) La N edge (99 eV) signal, and (e) Ti L edge (456 eV) signal, and La M edge (832 eV) signal.

Image of FIG. 4.
FIG. 4.

(a) HAADF image of defected region in BLT with the area from which EELS mapping was carried out highlighted with a green rectangle, (b) HAADF intensity recorded simultaneously during the EELS acquisition in the region of interest [green rectangle in (a)] are acquired, (c) the EELS composite Ti (red online) and La (green online) map, (d) La N edge (99 eV) signal, and (e) Ti L edge (456 eV) signal, and La M edge (832 eV) signal.

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/content/aip/journal/apl/95/19/10.1063/1.3258491
2009-11-09
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Locating La atoms in epitaxial Bi3.25La0.75Ti3O12 films through atomic resolution electron energy loss spectroscopy mapping
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/19/10.1063/1.3258491
10.1063/1.3258491
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