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Electrical behavior and oxygen vacancies in thin film
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10.1063/1.3259655
/content/aip/journal/apl/95/19/10.1063/1.3259655
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/19/10.1063/1.3259655
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of (a) Pt buffered silicon substrate, (b) BNBT, (c) BFO/BNBT, and (d) BFO thin films.

Image of FIG. 2.
FIG. 2.

FE-SEM images of (a) the cross section of bilayered BFO/BNBT thin film, and the surface morphologies of (b) BFO, (c) BNBT, and (d) BFO/BNBT thin films.

Image of FIG. 3.
FIG. 3.

(a) Frequency dependence of dielectric behavior, and (b) electric conduction of BFO/BNBT, BFO, and BNBT thin films. (c) curves of the bilayered BFO/BNBT thin film, where the insets are for the curves of BFO and BNBT thin films. (d) Magnetization (out of plane and in plane) of the BFO and BFO/BNBT thin films.

Image of FIG. 4.
FIG. 4.

(a) Fatigue behavior of the bilayered BFO/BNBT thin film, where the inset shows the curves before and after switching cycles. (b) dc conductivity vs plots at different frequencies for the bilayered BFO/BNBT thin film.

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/content/aip/journal/apl/95/19/10.1063/1.3259655
2009-11-09
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical behavior and oxygen vacancies in BiFeO3/[(Bi1/2Na1/2)0.94Ba0.06]TiO3 thin film
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/19/10.1063/1.3259655
10.1063/1.3259655
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