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Only peaks were observed in all the films on STO, LSAT, LAO, and YAO. The 200 substrate peak of each film was observed in the range of 50° to 60°. The data were recorded in a standard Bragg–Brentano geometry with radiation.
(a) Representative (103) pole figure of a Co-containing thin film on STO showed a clear fourfold symmetry. The film on YAO substrate contains 45° rotated grains, as shown in Fig. 2(b). The data were recorded in a texture goniometer system operating with radiation.
The lattice parameter decreases linearly with increasing for the grown films on STO, LSAT, LAO, and YAO. The lattice parameters, and , of the film on LAO are almost identical value of the bulk value.
(a) Temperature dependence of resistivity for the films on various substrate materials. The measurements were carried out by a standard four-probe method, in which a dc current of 1 mA was employed. A wide transition width of over 3 K was observed for the films on YAO, whereas the film on STO substrate shows an onset of 24.5 K with a sharp transition width of less than 2 K, as shown the inset. (b) Relationship between and the shows a linear dependence. is significantly affected by the lattice distortion.
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