Full text loading...
Low magnification electron micrographs of a polycrystalline sample of superconductor. (a) SEM image of a cleaved surface. (b) TEM bright field image and selected area electron diffraction pattern.
HAADF-STEM images of . (a) Low magnification image. (b) Atomic-resolution image. Incident electron beam along  zone axis.
EELS spectrum of fluorine-doped LaFeAsO. The energy loss range containing F-K, , and edges is shown. The inset shows the magnification of the background subtracted F-K and edges.
Atomic structure and STEM-EELS spectrum imaging of the fluorine-doped LaFeAsO. (a) Atomic structure projected along  direction. (b) HAADF image. [(c)–(f)] EELS spectrum images: (c) , (d) , (e) F-K edges. (f) Superimposed display of the elemental mapping as RGB components: La, red; F, green; Fe, blue. The energy windows used for the mapping of the elements were: 706.1–744.1 eV for , 832.1–870.1 eV for , and 688.6–704.1 eV for F-K.
Article metrics loading...