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Direct imaging of doped fluorine in superconductor by atomic scale spectroscopy
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10.1063/1.3263148
/content/aip/journal/apl/95/19/10.1063/1.3263148
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/19/10.1063/1.3263148
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Low magnification electron micrographs of a polycrystalline sample of superconductor. (a) SEM image of a cleaved surface. (b) TEM bright field image and selected area electron diffraction pattern.

Image of FIG. 2.
FIG. 2.

HAADF-STEM images of . (a) Low magnification image. (b) Atomic-resolution image. Incident electron beam along [100] zone axis.

Image of FIG. 3.
FIG. 3.

EELS spectrum of fluorine-doped LaFeAsO. The energy loss range containing F-K, , and edges is shown. The inset shows the magnification of the background subtracted F-K and edges.

Image of FIG. 4.
FIG. 4.

Atomic structure and STEM-EELS spectrum imaging of the fluorine-doped LaFeAsO. (a) Atomic structure projected along [100] direction. (b) HAADF image. [(c)–(f)] EELS spectrum images: (c) , (d) , (e) F-K edges. (f) Superimposed display of the elemental mapping as RGB components: La, red; F, green; Fe, blue. The energy windows used for the mapping of the elements were: 706.1–744.1 eV for , 832.1–870.1 eV for , and 688.6–704.1 eV for F-K.

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/content/aip/journal/apl/95/19/10.1063/1.3263148
2009-11-11
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct imaging of doped fluorine in LaFeAsO1−xFx superconductor by atomic scale spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/19/10.1063/1.3263148
10.1063/1.3263148
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