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Temperature evolution of XRD patterns of . (a) RT (native)—; and (b) and polycrystalline Ge (dashed line) and (solid line) references.
(a) Ge -edge of the native and differently annealed sample B. The spectral features related to the suboxide content in the samples are shaded gray. (b) Differences between the annealed and the native sample.
Phase separation parameter of different sample series. Samples from series A, B (with typical error bars), and C were annealed under constant inert gas flow, sample of Ref. 8 under vacuum. The regions of the phase separation as determined by XANES and nanocrystal (NC) formation as derived from XRD are indicated by arrows. The inset shows the time dependence of the annealing process.
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