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(a) Scheme of the layer sequence for the devices. (b) Side-face SEM micrograph of a cut made into a sample with a focused ion beam. The structured layer can be identified as bright spots between the layer and the patterned substrate.
Scheme of the measurement setup used for the angular resolved emission spectra analysis.
Measurement data of the angular resolved emission spectra analysis for layers of (a) and (b) . The TM-bands can be distinguished from the TE-bands.
Plot of the measured stopband width against the layer thickness .
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