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SEM plan views of samples (a) A and (b) B. In (a) and (b), left half: as-dealloyed; right half: as-sputtered.
Cross-sectional SEM micrographs of samples [(a) and (c)] A and [(b) and (d)] B. In (a) and (b), left half: as-dealloyed; right half: as-sputtered. Insets in (c) and (d) are enlarged from the boxed areas.
TEM plan-view images of dealloyed sample B. Inset in (a) is the selected-area diffraction pattern.
SEM image (enlarged from the inset) of an indent mark in sample B.
A summary of compositions before and after dealloying, hardness , and Young’s modulus of nanoporous Pt–Ni alloys.
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