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Oscillatory behavior of perpendicular magnetic anisotropy in films as a function of Al thickness
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10.1063/1.3269932
/content/aip/journal/apl/95/22/10.1063/1.3269932
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/22/10.1063/1.3269932
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Hall resistance as a function of Al thickness for samples in the as-deposited state and after annealing at 250 and .

Image of FIG. 2.
FIG. 2.

Hall resistance as a function of the magnetic field applied perpendicular to the layer plane for samples for different Al thicknesses in the as-deposited state (the inset shows an enlarged area).

Image of FIG. 3.
FIG. 3.

Variation of the anisotropy field as a function of Al thickness for samples in the (a) as-deposited state, (b) after annealing at , and (c) . Inset: Sketch of the microstructures in as-deposited (a) and annealed states [(b) and (c)].

Image of FIG. 4.
FIG. 4.

Cross-section HRTEM images of before (a) and after (c) heat treatment at . [(b) and (d)] correspond to dark field images of the same samples as in [(a) and (c)] but on different zones.

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/content/aip/journal/apl/95/22/10.1063/1.3269932
2009-12-03
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Oscillatory behavior of perpendicular magnetic anisotropy in Pt/Co/Al(Ox) films as a function of Al thickness
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/22/10.1063/1.3269932
10.1063/1.3269932
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