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Left panel: x-ray powder diffraction patterns of for selected compositions in a limited range. The * shows the nonperovskite impurity peak. The two figures in the right panel show scanning electron micrographs of the compositions (top) and 0.15 (bottom). The white bars indicate length of .
Composition variation of (a) tetragonal lattice parameters , cell volume of , and (b) tetragonality of Pr and La modified . The error bars associated with the data points are less than the size of the symbols.
Temperature dependence of (a) the relative permittivities of at 10 kHz and (b) relative permittivity of the composition at 1 kHz, 10 kHz, 100 kHz, and 1 MHz. The arrow indicates the data point corresponding to increasing frequency.
Curie–Weiss analysis (a), (b) and modified Curie–Weiss analysis (c), (d) as per Eq. (1) of for and 0.30. The arrows in (a) and (b) indicate and .
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