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(a) Out-of-plane and in-plane components of the magnetization as a function of external magnetic field for samples with no SL and 4.4 nm SL. (b) Saturation field as a function of ECL thickness. The inset in (b) sketches the VSM measurement setup. (c) Coercivity and remanent coercivity as a function of SL thickness. (d) Remanent coercivity as a function of field angle for different samples with SL thicknesses varied from 0 to 9.7 nm.
(a) Out-of-plane and in-plane components of the magnetization as a function of external magnetic field for samples with 4.4- and 7.9-nm-thick SL. (b) Expanded view of the signal. The open diamonds in (b) indicate the positions (i), (ii), and (iii) that correspond to the sketches of the magnetization of the two layers within the ECC structure.
measured under a field (a) and at remanence (b) for samples with different SL thicknesses from 0 to 9.7 nm. The inset in (b) shows the SL moment areal density at saturation (black squares), the corrected at 12 kOe (orange circles) extracted from (a) and compared to (open circles), as well as the corrected maximum (violet solid triangles) extracted from (a) and compared to (open triangles).
Difference between the moment signal at remanence and under field measured during a minor loop as a function of the field for both out-of-plane (a) and in-plane components (b), for different SL thicknesses. The inset in (a) represents an example of minor loops measured on the 7.9 nm SL sample.
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