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Electron bunch length monitors using spatially encoded electro-optical technique in an orthogonal configuration
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1.
1.See http://www-ssrl.slac.stanford.edu/lcls/ for ultrashort bunches.
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2.See http://zms.desy.de/ for intense short bunches.
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3.See http://www.rijnh.nl/research/guthz/felix_felice/ for tunable bunches.
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http://aip.metastore.ingenta.com/content/aip/journal/apl/95/23/10.1063/1.3266919
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FIG. 1.

(a) Schematic layout of the EO arrangement. (b) The EO module with a YAG crystal for electron beam position monitor.

Image of FIG. 2.

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FIG. 2.

Illustration of electron bunch length broadening caused by the finite thickness of the EO crystal. Each drawing represents a snapshot of the probe laser field interacting with the pancakelike Coulomb field, time starts from left to right.

Image of FIG. 3.

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FIG. 3.

Normalized EO signal when chicane compressor is (a) off, (b) chirp at −22°, and (c) chirp at −32°. Raw EO data , modeled electron bunch profile (red solid line), and calculated electron bunch profile after it is convoluted with the thickness of the EO crystal (black solid line). Inset in (b) shows the dependence of the EO signals on the transverse separation between the electron beam and the probe laser position in the ZnTe crystal; the curve is the 1/r fit to a set of EO experimental data.

Image of FIG. 4.

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FIG. 4.

Simulated EO signal pulse width plotted as a function of the electron pulse width for different thickness of ZnTe crystals. A laser pulse width of 120 fs is used in all simulations. Black straight line is the ideal undistorted behavior. Lines are connected for clarity.

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/content/aip/journal/apl/95/23/10.1063/1.3266919
2009-12-08
2014-04-24

Abstract

A single-shot, nondestructive, electro-optical, electron bunch length monitor is experimentally verified by encoding the Coulomb field of the bunch profile on the spatial intensity distribution of an unchirped femtosecond laser pulse in an orthogonal geometry, hence a temporal-to-spatial transformation. This electron bunch measurement scheme can simultaneously measure large timing jitter (approximately in picoseconds) with a wide measurement time span covering picosecond to subpicosecond ranges.

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Scitation: Electron bunch length monitors using spatially encoded electro-optical technique in an orthogonal configuration
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/23/10.1063/1.3266919
10.1063/1.3266919
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