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Trapping-detrapping fluctuations in organic space-charge layers
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1.
1.M. Muccini, Nature Mater. 5, 605 (2006).
http://dx.doi.org/10.1038/nmat1699
2.
2.A. Fleissner, H. Schmid, C. Melzer, and H. Seggern, Appl. Phys. Lett. 91, 242103 (2007).
http://dx.doi.org/10.1063/1.2820448
3.
3.C. Y. Chen, Y. -C. Chao, H. -F. Meng, and S. -F. Horng, Appl. Phys. Lett. 93, 223301 (2008).
http://dx.doi.org/10.1063/1.3027057
4.
4.D. V. Lang, X. Chi, T. Siegrist, A. M. Sergent, and A. P. Ramirez, Phys. Rev. Lett. 93, 076601 (2004).
http://dx.doi.org/10.1103/PhysRevLett.93.076601
5.
5.T. Miyadera, S. D. Wang, T. Minari, K. Tsukagoshi, and Y. Aoyagi, Appl. Phys. Lett. 93, 033304 (2008).
http://dx.doi.org/10.1063/1.2949746
6.
6.N. Koch, A. Elschner, R. L. Johnson, and J. P. Rabe, Appl. Surf. Sci. 244, 593 (2005).
http://dx.doi.org/10.1016/j.apsusc.2004.10.128
7.
7.Y. S. Yang, S. H. Kim, J. I. Lee, H. Y. Chu, L. M. Do, H. Lee, J. Oh, and T. Zyung, Appl. Phys. Lett. 80, 1595 (2002).
http://dx.doi.org/10.1063/1.1459117
8.
8.D. Knipp, R. A. Street, and A. R. Volkel, Appl. Phys. Lett. 82, 3907 (2003).
http://dx.doi.org/10.1063/1.1578536
9.
9.F. Dinelli, M. Murgia, P. Levy, M. Cavallini, and F. Biscarini, Phys. Rev. Lett. 92, 116802 (2004).
http://dx.doi.org/10.1103/PhysRevLett.92.116802
10.
10.C. H. Schwalb, S. Sachs, M. Marks, A. Schöll, F. Reinert, E. Umbach, and U. Höfer, Phys. Rev. Lett. 101, 146801 (2008).
http://dx.doi.org/10.1103/PhysRevLett.101.146801
11.
11.R. W. I. de Boer, M. Jochemsen, T. M. Klapwijk, A. F. Morpurgo, J. Niemax, A. K. Tripathi, and J. Pflaum, J. Appl. Phys. 95, 1196 (2004).
http://dx.doi.org/10.1063/1.1631079
12.
12.J. H. Kang, Appl. Phys. Lett. 86, 152115 (2005).
http://dx.doi.org/10.1063/1.1900944
13.
13.W. Chandra, L. K. Ang, and K. L. Pey, Appl. Phys. Lett. 90, 153505 (2007).
http://dx.doi.org/10.1063/1.2721382
14.
14.M. Giulianini, E. R. Waclawik, J. B. Bell, and N. Motta, Appl. Phys. Lett. 94, 083302 (2009);
http://dx.doi.org/10.1063/1.3086882
14.I. Torres, D. M. Taylor, and E. Itoh, Appl. Phys. Lett. 85, 314 (2004).
http://dx.doi.org/10.1063/1.1769081
15.
15.T. G. M. Kleinpenning, Physica B & C 94, 141 (1978);
http://dx.doi.org/10.1016/0378-4363(78)90137-7
15.F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, Rep. Prog. Phys. 44, 479 (1981).
http://dx.doi.org/10.1088/0034-4885/44/5/001
16.
16.C. M. Van Vliet, J. Appl. Phys. 93, 6068 (2003).
http://dx.doi.org/10.1063/1.1563291
17.
17.C. Pennetta, E. Alfinito, and L. Reggiani, J. Stat. Mech.,P02053 (2009).
http://dx.doi.org/10.1088/1742-5468/2009/02/P02053
18.
18.P. Verleg and J. I. Dijkhuis, Phys. Rev. B 58, 3904 (1998).
http://dx.doi.org/10.1103/PhysRevB.58.3904
19.
19.A. Carbone and P. Mazzetti, J. Appl. Phys. 80, 1559 (1996);
http://dx.doi.org/10.1063/1.362952
19.A. Carbone and P. Mazzetti, Phys. Rev. B 49, 7592 (1994);
http://dx.doi.org/10.1103/PhysRevB.49.7592
19.A. Carbone and P. Mazzetti, Phys. Rev. B 49, 7603 (1994).
http://dx.doi.org/10.1103/PhysRevB.49.7603
20.
20.A. Tsormpatzoglou, D. H. Tassis, and C. A. Dimitriadis, J. Appl. Phys. 100, 074313 (2006).
http://dx.doi.org/10.1063/1.2357642
21.
21.A. Carbone, B. K. Kotowska, and D. Kotowski, Phys. Rev. Lett. 95, 236601 (2005);
http://dx.doi.org/10.1103/PhysRevLett.95.236601
21.A. Carbone, B. K. Kotowska, and D. Kotowski, Eur. Phys. J. B 50, 77 (2006).
http://dx.doi.org/10.1140/epjb/e2006-00146-5
22.
22.O. D. Jurchescu, B. H. Hamadani, H. D. Xiong, S. K. Park, S. Subramanian, N. M. Zimmerman, J. E. Anthony, T. N. Jackson, and D. J. Gundlach, Appl. Phys. Lett. 92, 132103 (2008).
http://dx.doi.org/10.1063/1.2903508
23.
23.P. V. Necliudov, S. L. Rumyantsev, M. S. Shur, D. J. Gundlach, and T. N. Jackson, J. Appl. Phys. 88, 5395 (2000);
http://dx.doi.org/10.1063/1.1314618
23.S. Martin, A. Dodabalapur, Z. Bao, B. Crone, H. E. Katz, W. Li, A. Passner, and J. A. Rogers, J. Appl. Phys. 87, 3381 (2000);
http://dx.doi.org/10.1063/1.372354
23.M. Sampietro, G. Ferrari, and D. Natali, Appl. Phys. Lett. 78, 3262 (2001).
http://dx.doi.org/10.1063/1.1374516
24.
24.P. Mark and W. Helfrich, J. Appl. Phys. 33, 205 (1962).
http://dx.doi.org/10.1063/1.1728487
25.
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Figures

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FIG. 1.

Current voltage characteristics at for a tetracene thin film of length and cross-sectional area . Circles refer to experimental data. (Ref. 21) Dotted lines indicate the Ohmic region at the low voltage, the TFT region between and and the SCLC region at the high voltage . Solid line is obtained by fitting the data by Eq. (9).

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FIG. 2.

Relative current noise spectral density at and vs applied voltage. Circles refer to experimental data. (Ref. 21) Dashed lines represent, respectively: (i) the Ohmic noise component at low voltages, (ii) the trapping-detrapping noise component at intermediate voltages, (iii) the SCLC noise component at high voltage. Solid line is obtained by summing the three noise components according to Eq. (7).

Tables

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Table I.

Relevant parameter range for tetracene.

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/content/aip/journal/apl/95/23/10.1063/1.3271769
2009-12-08
2014-04-17

Abstract

A trapping-detrapping model is proposed for explaining the current fluctuation behavior in organic semiconductors (polyacenes) operating under current-injection conditions. The fraction of ionized traps obtained from the current-voltage characteristics, is related to the relative current noise spectral density at the trap-filling transition. The agreement between theory and experiments validates the model and provides an estimate of the concentration and energy level of deep traps.

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Scitation: Trapping-detrapping fluctuations in organic space-charge layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/23/10.1063/1.3271769
10.1063/1.3271769
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