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Schematic of our samples (a) Cross section: Schottky contact formed at the interface of Ag and p-Si, ohmic contact formed at the interface of Al and p-Si. (b) Sketch of patterns on the Ag film. (c) curve of our samples. (d) Sketch of our experimental set-up.
(a) Measured currents vs periods, ranging from 495 to 905 nm, both without and with reverse bias voltages. Dotted-dashed lines represent approximate periods to excite SPP while dotted lines represent periods where Wood’s anomaly occurs. (b) Distribution of (parallel to the surface) in a unit cell at the period of 635 nm. (c) Distribution of (parallel to the surface) in a unit cell at the period of 595 nm.
Measured photocurrents vs reverse bias voltages at the periods corresponding to SPP and Wood’s anomaly .
Periods corresponding to Wood’s anomaly at the Ag–Si interface, represents the reciprocal vector.
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