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A schematic diagram of the type of structure that is suitable for the observation of hybrid Tamm plasmon-exciton-polariton states. The substrate is on the right-side of the structure but is not shown.
The profiles of the electric field squared and the refractive index for (a) the TSP localized at the interface between a 50 nm gold film and a Bragg reflector with complex energy , (b) the microcavity photon mode localized between two Bragg reflectors with energy , and (c) the lowest energy coupled state of the Tamm plasmon and the microcavity photon mode with energy . The refractive indexes are , . The Bragg frequency and the resonant frequency of the one-wavelength microcavity correspond to 1.55 eV. The thickness of the layer adjacent to the gold is chosen to tune the TSP to 1.55 eV and the plasma frequency of gold is taken as .
The real parts of the eigenenergies of the hybrid Tamm plasmon-exciton-polariton modes (a) as a function of the width of the semiconductor layer adjacent to the gold, and (b) as a function of the thickness of the gold. The vertical bars give the imaginary parts of the eigenenergies. The offset of the hybrid state with respect to the cavity polariton state is indicated by the horizontal dashed lines. The parameters of the structure are the same as for Fig. 2(c) but there are four QWs in the cavity in this case. The QW exciton oscillator strength is taken as 0.026 meV.
The in-plane dispersion curves of the hybrid Tamm-plasmon-exciton-polariton modes. The solid (dashed) lines correspond to the TE (TM) polarization.
The in-plane effective masses relative to the electron mass for the TE- and TM-polarized cavity modes, TSP, and exciton modes.
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