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Gate-to-drain capacitance verifying the continuous-wave green laser crystallization n-TFT trapped charges distribution under dc voltage stress
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10.1063/1.3275728
/content/aip/journal/apl/95/25/10.1063/1.3275728
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/25/10.1063/1.3275728
/content/aip/journal/apl/95/25/10.1063/1.3275728
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/content/aip/journal/apl/95/25/10.1063/1.3275728
2009-12-23
2014-11-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Gate-to-drain capacitance verifying the continuous-wave green laser crystallization n-TFT trapped charges distribution under dc voltage stress
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/25/10.1063/1.3275728
10.1063/1.3275728
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