1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Si segregation in polycrystalline films with grain-size control
Rent:
Rent this article for
USD
10.1063/1.3276073
/content/aip/journal/apl/95/25/10.1063/1.3276073
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/25/10.1063/1.3276073

Figures

Image of FIG. 1.
FIG. 1.

Evolution of average grain sizes of films grown at (black triangles), −500 (green triangles), −750 (blue squares), and −990 V (red circles) with respect to the annealing period. Dotted lines are guides to the eye.

Image of FIG. 2.
FIG. 2.

TEM images of polycrystalline films grown at (a) and (b) −990 V. The grain-size evolution is shown with increasing annealing period from 0 to 9 h.

Image of FIG. 3.
FIG. 3.

XRD patterns for the 5 h annealed films grown at (black line), −500 (green line), −750 (blue line), and −990 V (red line). peaks are indicated with circles and Si peaks are shown with squares.

Image of FIG. 4.
FIG. 4.

Annealing-time dependence of (a) saturation magnetization and (b) coercivity for the film grown at (black triangles), −500 (green triangles), −750 (blue squares), and −990 (red circles) V. Dotted lines are guides to the eye.

Tables

Generic image for table
Table I.

Chemical compositions of the films measured by EDX. Those for segregated particles are shown in parenthesis.

Loading

Article metrics loading...

/content/aip/journal/apl/95/25/10.1063/1.3276073
2009-12-23
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Si segregation in polycrystalline Co2MnSi films with grain-size control
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/25/10.1063/1.3276073
10.1063/1.3276073
SEARCH_EXPAND_ITEM