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Evolution of average grain sizes of films grown at (black triangles), −500 (green triangles), −750 (blue squares), and −990 V (red circles) with respect to the annealing period. Dotted lines are guides to the eye.
TEM images of polycrystalline films grown at (a) and (b) −990 V. The grain-size evolution is shown with increasing annealing period from 0 to 9 h.
XRD patterns for the 5 h annealed films grown at (black line), −500 (green line), −750 (blue line), and −990 V (red line). peaks are indicated with circles and Si peaks are shown with squares.
Annealing-time dependence of (a) saturation magnetization and (b) coercivity for the film grown at (black triangles), −500 (green triangles), −750 (blue squares), and −990 (red circles) V. Dotted lines are guides to the eye.
Chemical compositions of the films measured by EDX. Those for segregated particles are shown in parenthesis.
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