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(a) scan in a Nb film at 4.3 K, 30 mT; individual vortices can be clearly resolved (b) image of an individual vortex acquired in the external field of 1 mT, the cantilever resonance frequency changes as a function of the field above the vortex.
(a) Topographic AFM image of the film. The film exhibits granular structure with grain sizes approximately . The color scale corresponds to the high variation of 5 nm. (b) High resolution SEM image of a cantilever tip (courtesy of Nanosensors Inc.)
Comparison of the model to the experimental data (circles) for lateral scans (a)–(d), and the probe-sample separation (vertical) scans, (e). (dotted line),111 nm (solid line, best fit, see text), 161 nm (dashed line). The probe-sample distance is indicated in each panel. (f): comparison of the fits for with the same tip shape and overall tip heights of (solid), (dashed), and (dotted). It follows that, for a given geometry, the part of the tip far from the sample does not affect the obtained value of the penetration depth.
Fit quality for the FWHM of the (a) lateral scan and for the (b) vertical scan for 26, 78, 183, and 273 nm probe-sample separations.
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