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The origin of 2.78 eV emission and yellow coloration in bulk AlN substrates
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10.1063/1.3276567
/content/aip/journal/apl/95/26/10.1063/1.3276567
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/26/10.1063/1.3276567
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Room temperature (300 K) and (b) low temperature (10 K) PL spectra of AlN hetero-epilayer, polycrystalline AlN, and bulk AlN single crystal under above band-gap excitation scheme with 197 nm laser.

Image of FIG. 2.
FIG. 2.

Low temperature (10 K) PL spectra of AlN hetero-epilayer, polycrystalline AlN, and bulk AlN single crystal under: (a) above (197 nm) and (b) below (262 nm) band gap excitation.

Image of FIG. 3.
FIG. 3.

(a) Temperature dependent PL spectra of bulk m-AlN around 2.78 eV with 262 nm excitation from 10 to 400 K. (b) The Arrhenius plot of the PL intensity of 2.78 eV emission line in m-AlN bulk.

Image of FIG. 4.
FIG. 4.

(a) Excitation intensity dependent PL spectra measured on bulk m-AlN single crystal around 2.73 eV emission line with 197 nm excitation. (b) Peak emission intensity at 2.73 eV as a function of excitation intensity.

Image of FIG. 5.
FIG. 5.

Energy level diagram of isolated aluminum vacancies in AlN including the two charge states, and , of level with a small lattice relaxation (SLR) between these two states.

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/content/aip/journal/apl/95/26/10.1063/1.3276567
2009-12-29
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The origin of 2.78 eV emission and yellow coloration in bulk AlN substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/26/10.1063/1.3276567
10.1063/1.3276567
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