Full text loading...
Representative RHEED images observed during the growth of thin films on YSZ(001) taken in the (top) and (bottom) azimuth under oxygen-rich (red solid frame) and indium-rich (blue dotted frame) growth conditions. The shadow edge is at the top of the images.
Growth diagram giving the growth rate as a function of oxygen BEP at a constant In BEP of . The solid lines are guides to the eyes. Datapoint labels denote the rms-roughness (nm) of the film surface. Inset: Growth rate as function of In BEP for constant oxygen BEP of .
Morphology of the sample surfaces of S1 (top), S2 (center), S3 (bottom) represented by cross-sectional SEM images with 5° tilt (left), the RHEED patterns at the end of the growth (left inset), and AFM images (right). The 500 nm scale bar and the horizontal  direction arrow apply to AFM and SEM images. Sample description and AFM height scale are given on top of the AFM images.
Article metrics loading...