1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Resistance to edge recombination in GaAs-based dots-in-a-well solar cells
Rent:
Rent this article for
USD
10.1063/1.3277149
/content/aip/journal/apl/95/26/10.1063/1.3277149
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/26/10.1063/1.3277149

Figures

Image of FIG. 1.
FIG. 1.

Photocurrent of DWELL and GaAs control cell of different sizes (, , and ) under AM 1.5 global illumination. The inserted picture is the schematic diagram of the DWELL solar cell with six-stacks of InAs QDs embedded in InGaAs quantum wells.

Image of FIG. 2.
FIG. 2.

A comparison of the dark behavior of GaAs control and DWELL cells for the same dimensions (, , and ). (a) Measured and simulated local ideality factor for the control cells, (b) Measured and simulated semi-logarithmic dark current density for the control cells, (c) Tested local ideality factor, and (d) Dark current density for DWELL cells. The simulation is based on Eq. (3), where the parameters extracted by curve fitting are illustrated in Table II.

Tables

Generic image for table
Table I.

Measured short circuit current densities , open circuit voltages , and efficiencies of the GaAs control cells and InAs DWELL solar cells under AM 1.5 G illumination.

Generic image for table
Table II.

Parameters used in curve-fitting control samples using SRH statistics.

Loading

Article metrics loading...

/content/aip/journal/apl/95/26/10.1063/1.3277149
2009-12-30
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Resistance to edge recombination in GaAs-based dots-in-a-well solar cells
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/26/10.1063/1.3277149
10.1063/1.3277149
SEARCH_EXPAND_ITEM