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Powder x-ray diffraction patterns of (a) and (b) . The impurity phases are and CeAs (&) for samples without Y and (*) for Y-doped sample. Inset of figure shows resistivity plot for (○) and (●).
Temperature dependence of the electrical resistivity of under varying magnetic fields (0–4 T). Upper inset shows the inductive part of susceptibility as a function of temperature and the lower inset depicts the temperature dependence of upper critical field as a function of temperature for (◼) and (○).
Magnetic field dependence of magnetization hysteresis loop width at 4.2, 15, and 30 K for (closed symbols) in comparison with (open symbols). Inset shows the magnetization hysteresis loop at 4.2 K for polycrystalline and defines procedure for determination of .
The field-dependent remanent magnetization at 5 K for both samples. The inset shows the temperature dependence of lower critical field .
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