1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Investigation of compositional inhomogeneities in complex polycrystalline layers for solar cells
Rent:
Rent this article for
USD
10.1063/1.3280049
/content/aip/journal/apl/95/26/10.1063/1.3280049
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/26/10.1063/1.3280049
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM image of the cross-section of a solar cell developed with the low temperature grown CIGS layer.

Image of FIG. 2.
FIG. 2.

Raman spectra measured after sputtering the CIGS layer with different times: (a) 0 min, (b) 5 min, (c) 10 min, (d) 15 min, (e) 20 min, (f) 25 min, (g) 30 min, (h) 35 min, and (i) 40 min. The spectra are normalized to the intensity of the main CIGS mode, and spectra obtained after different sputter times are vertically shifted. Inset in the figure shows the plot of the frequency of the CIGS mode vs sputter time.

Image of FIG. 3.
FIG. 3.

Elemental in-depth distribution and relative concentration as obtained by SNMS measurements.

Loading

Article metrics loading...

/content/aip/journal/apl/95/26/10.1063/1.3280049
2009-12-31
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Investigation of compositional inhomogeneities in complex polycrystalline Cu(In,Ga)Se2 layers for solar cells
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/26/10.1063/1.3280049
10.1063/1.3280049
SEARCH_EXPAND_ITEM