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XRD scans of BST thin films postannealed at 550, 630, and . The insets show cross-sectional TEM images from the latter BST layers.
AFM micrographs performed on BST films postannealed at (a) 300, (b) 550, (c) 630, and (d) . Scan area is the same for all the images: .
Relative tunability vs crystallites ratio of BST.
Comparison of dielectric parameters measured on samples annealed at 550, 630, and .
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