No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Self-organized nanocomposite with improved figure of merit
1.B. Noren, Microwave J. 47, 210 (2004).
2.R. Ramesh, Thin Film Ferroelectric Materials and Devices (Kluwer Academic, Boston, 1997).
3.O. Auciello, J. F. Scott, and R. Ramesh, Phys. Today 51, 22 (1998).
13.Y. Xia, K. Yin, C. Xu, Y. Zhang, B. Xu, W. He, X. Meng, J. Yin, and Z. Liu, Appl. Phys. Lett. 92, 102906 (2008).
14.Calculations are done with typical values of dielectric constants, i.e., for amorphous phase and for crystalline phase ; for the coefficient of dielectric nonlinearity in the ferroelectric we took .
15.Global emerging volume and mean emerging height are estimated on each picture thanks to Nanoscope software (AFM pictures analysis). Practically, we cut virtually the sample surface with a plane; the software gives the volume and mean height above this plane. We choose a plane as close as possible to the amorphous surface, in order to that all emerging nanoislands are included in the calculation.
Article metrics loading...
Full text loading...
Most read this month