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On the noise of triple-gate field-effect transistors with high- gate dielectric
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10.1063/1.3180703
/content/aip/journal/apl/95/3/10.1063/1.3180703
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/3/10.1063/1.3180703
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Drain current noise spectral density multiplied by the frequency for the SOI with a gate dielectric; , , and .

Image of FIG. 2.
FIG. 2.

Drain current noise spectral density multiplied by the frequency for the (a) and (b) with a gate dielectric; , , and .

Image of FIG. 3.
FIG. 3.

Equivalent gate voltage noise normalized for and at different gate voltage overdrives for sSOI, , and with a gate dielectric measured at and 3 kHz; , , and and 1.

Image of FIG. 4.
FIG. 4.

Distribution of slow traps concentration over the gate dielectric thickness for sSOI with the (curve 1) and (curve 2) gate dielectric; , , or 1.

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/content/aip/journal/apl/95/3/10.1063/1.3180703
2009-07-20
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: On the 1/f noise of triple-gate field-effect transistors with high-k gate dielectric
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/3/10.1063/1.3180703
10.1063/1.3180703
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