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(a) The four-probe configuration for measurement of in-plane thermal conductivity of a conducting PANI film on an insulating substrate. (b) Scanning electron microscopic image of the specimen. Scale bar is .
(a) Frequency dependence of the third harmonic in the range of 1–30 Hz for 20 nm thick PANI thin films. The amplitude of the supplied current is . (b) Dependence of the third harmonic on the applied current at 4 Hz for 20 nm thick PANI thin films (value of is the amplitude of the current).
In-plane thermal conductivity of PANI specimens as a function of film thickness.
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