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(a) Ionicity-hybridization map of potential phase change materials. (b) Sheet resistance of films as a function of temperature with a heating/cooling rate of 10 K/min.
(a) Sheet resistance of film as a function of temperature with different heating rate, and the inset shows the Kissinger plot for calculation. (b) Plot of “time to failure” vs reciprocal temperature (isothermal process), showing data retention time.
(a) Carrier density and Hall mobility of film as a function of temperature. (b) XRD results of amorphous and crystalline films, and the inset shows the TEM photo of crystalline film and the selected area electron diffraction pattern.
(a) XPS spectra of Sn of crystalline film. (b) curves of PCM cell using film with different reset pulse widths, and the inset shows the curves obtained on the same PCM cell.
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