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Manipulation of islands on the rutile (110) surface using noncontact atomic force microscopy
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View: Figures


Image of FIG. 1.
FIG. 1.

Comparison of two NC-AFM forward-scan images at a frequency shift setpoint of −10.4 Hz before and after a stepwise increase in the frequency shift setpoint to −25.1 Hz (this series can be seen in Ref. 28). Each image is shown with the topographic (left panel) and frequency shift channel (right panel). At a frequency shift setpoint of −25.1 Hz, the interaction between tip and molecules induced an almost quadratic hole by the removal of seventeen molecules (12 from the plain island and 5 from the upper domain boundary). Additionally, a reordering of the left domain boundary was observed. In both images, a single missing molecule is marked as a reference point.

Image of FIG. 2.
FIG. 2.

Forward (a) and backward scan (b) and the frequency shift channel. In the upper part, the frequency shift setpoint was set to −25.1 Hz as indicated in the images. After the manipulation happened in the area enclosed by dotted lines, the frequency shift was set to −19.1 Hz for stable imaging. Analyzing the area where manipulation was achieved reveals two line scans in the forward scan with a positive frequency shift, which is related to a repulsive interaction between tip and molecules (see Ref. 33).

Image of FIG. 3.
FIG. 3.

Series of NC-AFM images at almost the same frequency shift setpoint (13.0–15.0 Hz), , frequency shift channel, and backward scans. The first image is taken approximately 100 min after molecule deposition. All following images are taken successively with a time per frame of 9 min 20 s. The isolated island in the upper part of the image shrinks in size during scanning until it completely vanishes. In image (k) a substrate depression is observed, which is assumed to represent the nucleation seed for the island growth (see Ref. 27).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Manipulation of C60 islands on the rutile TiO2 (110) surface using noncontact atomic force microscopy