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Photograph of the crystal used to prepare substrates in front of a dime.
(a) X-ray diffraction spectrum showing the crystallinity of the substrate. (b) AFM image showing the morphology of the substrate [here (011)-oriented ].
(a) x-ray diffraction spectrum showing both the signature of the (011)-oriented substrate and the (100)-plane grown InN film. (b) AFM image showing the morphology of the -plane InN epilayer. (c) PL spectra taken at liquid nitrogen for the thick -plane (blue line) and for conventional InN films (red line).
Linear plot of the normalized PL intensity for (100)-plane (red line) and for conventional InN films (blue line) vs reciprocal temperature.
Temperatures of phase transitions observed on piezoelectric materials and quartz at atmospheric pressure (Ref. 11).
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