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Pole figure XRD patterns probing the (001) orientation in films grown on (a) -plane, (b) -plane, (c) -plane, (d) -plane, (e) -plane, and (f) -plane substrate.
The cross-sectional TEM image near the interface and the magnified view of the layer in the -plane heterostructure.
The response of thin film upon illumination of NIR lamp. (a) The experimental setup for measuring the ODTE effect. (b) The voltage change along the direction in which the planes are inclinedly aligned and its perpendicular direction . The case for -plane heterostructure is shown for example. (c) Steady-state of thin films with different plane inclination angle .
Summary of the plane [(001) plane] orientation of the films grown on different substrates; and is the inclination angle of and with respect to the substrate surface. The inclination angle of is nearly equal to .
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