Full text loading...
Optical indices of sample M60 deposited at a substrate tilt of 60°; (a) refractive indices before and (b) after UV irradiation.
(a) The increase in extinction coefficient due to UV irradiation and (b) plot of average values of (800 nm) as a function of substrate tilt.
Cross section (left) and plan (right) views of GLAD films, made with substrate tilt of 0°, 60°, and 80°. The scale bar represents 200 nm.
(a) Semiconductor band gap of sample M60 and variation of band gap with the evaporation (substrate tilt) angle (inset) and (b) absorption coefficient at 380 nm.
Thickness and optical characteristics of select samples.
Article metrics loading...