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HRXRD measurement of a 81 nm SCRO film at 310 K with the BTO substrate in the tetragonal phase. (a) scan. The inset shows the SCRO (004) reflection and the BTO substrate reflection which is split into domains [BTO (200)/(020)] and domains [BTO (002)]. In the main figure only the domains are indexed. (b) and (c): RSM around the SCRO (004) and (116) reflections. Clearly the different reflections of the BTO domains are visible.
Temperature dependence of the longitudinal resistivity at (a) and (b) 0 T. Panel (c) shows magnetization vs temperature at . Jumps both in and at the temperatures of the phase transitions of BTO (dotted lines) are observed. For the calculation of a temperature independent sample length and cross-sectional area was assumed. The black triangles indicate the temperatures at which the curves of Fig. 3 were taken.
Magnetization vs external magnetic field. (a) Hysteresis loops at 290, 270, 200, and 180 K with the external magnetic field applied along BTO . (b) Illustration of the different orientations of the external field. In panels (c)–(f), hysteresis loops at specific temperatures for different orientations of the external magnetic field are shown.
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