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Observation of electron tunneling induced photon emission in gallium (Ga) doped (1%) zinc oxide (ZnO) sample using scanning tunneling microscopy
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10.1063/1.3200241
/content/aip/journal/apl/95/6/10.1063/1.3200241
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/6/10.1063/1.3200241
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) STM topography scan [scan size: , , and ] (square marks the area consisting of rodlike structure and triangle marks the area where nanoparticles are seen), (b) STM topography scan [scan size: , , and ], (c) line profile drawn along the line shown in Fig. 1(b) [inset: high resolution image of the region marked by the “triangle” in Fig. 1(a)], and (d) characteristic curves [inset: Fowler–Nordheim plot; , ].

Image of FIG. 2.
FIG. 2.

(a) STM topography scan [scan size: , , and ] (square marks the area comprising “crater”-like structure) (b) STM photon scan [scan size: , , and ], (c) line profile drawn on the line shown in (a) and (d) line profile drawn on the line shown in (b).

Image of FIG. 3.
FIG. 3.

(a) Photon counts vs characteristic at different tunneling currents, (b) vs plot along with the linear fit, (c) localized photon emission spectroscopy. The prominent transition is marked by the dashed line and (d) Defects levels in ZnO film. The various defects level marked in the figure are: (i) : zinc vacancy, (ii) : oxygen vacancy, (iii) : Interstitial zinc, (iv) : interstitial oxygen, and (v) : antisite oxygen.

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/content/aip/journal/apl/95/6/10.1063/1.3200241
2009-08-11
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Observation of electron tunneling induced photon emission in gallium (Ga) doped (1%) zinc oxide (ZnO) sample using scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/6/10.1063/1.3200241
10.1063/1.3200241
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