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RHEED patterns along  azimuth of (a) Ge buffer layer, (b) film, (c) film, and (d) XRD scan of substrate and films with and 10.4%.
(a) Hysteresis loops of the films with , 4.1%, 5.1%, 7.2%, and 10.4% measured at 5 K. (b) The hysteresis loop of the film with magnetic field parallel and perpendicular to the film plane, respectively.
The temperature dependence of the sheet resistance of film on substrate and the pure substrate. The inset shows the corresponding dependence of on for the film on substrate. The solid straight line is a guide to eyes.
The magnetic field dependence of Hall resistivity (the curve) of film measured at (a) 30 K, (b) 50 K, (c) 75 K, and (d) 130 K, respectively.
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