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Quasifree Mg–H thin films
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View: Figures


Image of FIG. 1.
FIG. 1.

Effect of a Ti buffer layer on the thermodynamic properties of Mg thin films. (a) PTIs measured at 333 K for (lines) Pd-capped samples, as already published in Ref. 7 and (symbols) Ti-buffer samples. The Mg thicknesses are in both cases , 20, 30, and 40 nm. (b) Thickness dependence of the plateau width, , expressed in optical transmission, of Pd-capped and Ti-buffer samples.

Image of FIG. 2.
FIG. 2.

(a) PTIs of 20 nm thick Mg films both in the Pd-capped (top bundle of curves) and Ti-buffer (bottom bundle) geometries, for the first 4 hydrogenation cycles at 333 K. Note that the plateau pressures for all the cycles, except the first one, remain unchanged. (b) Evolution of the plateau width upon cycling.

Image of FIG. 3.
FIG. 3.

Mg sample deposited on a glass wafer and partially covered with a 2 nm thin Ti layer. (a) Sketch of the sample architecture. (b) PTIs measured during loading at 333 K. (c) Unloading sequence of the same sample when exposed to of mixture at 333 K.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quasifree Mg–H thin films