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Effect of a Ti buffer layer on the thermodynamic properties of Mg thin films. (a) PTIs measured at 333 K for (lines) Pd-capped samples, as already published in Ref. 7 and (symbols) Ti-buffer samples. The Mg thicknesses are in both cases , 20, 30, and 40 nm. (b) Thickness dependence of the plateau width, , expressed in optical transmission, of Pd-capped and Ti-buffer samples.
(a) PTIs of 20 nm thick Mg films both in the Pd-capped (top bundle of curves) and Ti-buffer (bottom bundle) geometries, for the first 4 hydrogenation cycles at 333 K. Note that the plateau pressures for all the cycles, except the first one, remain unchanged. (b) Evolution of the plateau width upon cycling.
Mg sample deposited on a glass wafer and partially covered with a 2 nm thin Ti layer. (a) Sketch of the sample architecture. (b) PTIs measured during loading at 333 K. (c) Unloading sequence of the same sample when exposed to of mixture at 333 K.
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